Scatex
TheNewScatterfreePinholesParasiticscatteringcausedbyaperturesisawell-knownprobleminX-rayanalytics,whichforcesusersandmanufacturerstoadapttheirexperimentalsetupstothisunwantedphenomenon.Increasedmeasur
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TheNewScatterfreePinholesParasiticscatteringcausedbyaperturesisawell-knownprobleminX-rayanalytics,whichforcesusersandmanufacturerstoadapttheirexperimentalsetupstothisunwantedphenomenon.Increasedmeasur
The New Scatterfree PinholesParasitic scattering caused by apertures is a well-known problem in X-ray analytics, which forces users and manufacturers to adapt their experimental setups to this unwanted phenomenon. Increased measurement times due to lower photon fluxes, a lower resolution caused by an enlarged beam stop, a larger beam defining pinhole-to-sample distance due to the integration of an antiscatter guard and generally a lower signal-to-noise ratio leads to a loss in data quality.
Key Features of SCATEX
A reduction of the parasitic aperture scattering is possible by using scatterless slits. However, since the noise signal is generally still too high, synchrotron facilities, for example, are required to further use antiscatter guards. Furthermore, (scatterless) slit systems suffer from the rectangular beam shaping which increases the beam stop size by at least 41.4% (corresponds to √2) compared to a circular beam shaping pinhole. Thus, beam definition with pinholes is advantageous as it enables a considerably higher resolution. The new SCATEX pinholes produce almost no parasitic scattering and overcome the aforementioned problems: hence, antiscatter pinholes become dispensable, system sizes shrink, resolution and photon flux increase, data quality improves. SCATEX Pinholes for SAXS Home-lab Systems SCATEX Pinholes for Synchrotrons
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